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Introduction to Focused Ion Beam Nanometrology (Iop Concise Physics) (Paperback)
By
David C. Cox
$99.95
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Description
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Product Details
ISBN:
9781681740201
ISBN-10:
1681740206
Publisher:
Morgan & Claypool
Publication Date:
October 1st, 2015
Pages:
104
Language:
English
Series:
Iop Concise Physics
Categories
Measurement
Scientific Instruments
Weights & Measures
Related Editions (all)
Hardcover (October 1st, 2015): $120.00